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Effects of Asymmetric Distribution of Charged Defects on the Hysteresis Curves of Ferroelectric Capacitors
Effects of Asymmetric Distribution of Charged Defects on the Hysteresis Curves of Ferroelectric Capacitors
상세정보
- 자료유형
- 기사
- ISSN
- 12269360
- 서명/저자
- Effects of Asymmetric Distribution of Charged Defects on the Hysteresis Curves of Ferroelectric Capacitors / Kang-Woon Lee, Yong-Il Kim, WOn-Jong Lee 공저
- 발행사항
- 서울 : 한국마이크로전자및 패키징학회, 2005.
- 형태사항
- pp. 219-226
- 기본자료저록
- 마이크로전자 및 패키징 학회지=Journal of the Microelectronics and Pack : 2005 Vol. 12 No.3 ((36)) 2005, 09
- 모체레코드
- 모체정보확인
- Control Number
- kjul:60075314
MARC
008060503s2005 ULKa a KOR■022 ▼a12269360
■245 ▼aEffects of Asymmetric Distribution of Charged Defects on the Hysteresis Curves of Ferroelectric Capacitors▼dKang-Woon Lee, Yong-Il Kim, WOn-Jong Lee 공저
■260 ▼a서울▼b한국마이크로전자및 패키징학회▼c2005.
■300 ▼app. 219-226
■653 ▼aEFFECTS▼aASYMMETRIC▼aDISTRIBUTION▼aCHARGED▼aDEFECTS▼aHYSTERESIS▼aCURVES▼aFERROELECTRIC▼aCAPACITORS
■700 ▼aKang-Woon Lee, Yong-Il Kim, WOn-Jong Lee
■773 ▼t마이크로전자 및 패키징 학회지=Journal of the Microelectronics and Pack▼g2005 Vol. 12 No.3 ((36))▼d2005, 09
■URL ▼ahttp://www.imapsk.or.kr
■SIS ▼aS023546▼b60075252▼h8▼s2
