MARC

 008050714s2002        ULKa    a                          KOR
■022    ▼a12296368
■245    ▼aSystem-On-a-Chip(SOC)에  대한  효율적인  테스트  데이터  압축  및  저전력  스캔  테스트▼d정준모,  정정화  공저
■260    ▼a서울▼b대한전자공학회▼c2002.
■300    ▼app.  45-54
■653    ▼aSYSTEMONACHIPSOC에▼a대한▼a효율▼a적인▼a테스트▼a데이터▼a압축▼a저전▼a스캔
■700    ▼a정준모,  정정화
■773    ▼t전자공학회논문지SD(Semiconductor  and  Devices)  :  반도체▼g제39권  제12호  (2002  12)▼d2002,  12
■SIS    ▼aS009647▼b60014354▼h8▼s2

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