MARC

 008050714s2001        ULKa    a                          KOR
■022    ▼a12296368
■245    ▼a실리콘  기판  두께에  따른  PZT  박막  적외선  감지소자의  성능  변화▼d고종수,  Weiguo  Liu,  Weiguang  Zhu  공저
■260    ▼a서울▼b대한전자공학회▼c2001.
■300    ▼app.  17-26
■653    ▼a실리콘▼a기판▼a두께▼aPZT▼a박막▼a적외선▼a감지▼a성능▼a변화
■700    ▼a고종수,  Weiguo  Liu,  Weiguang  Zhu
■773    ▼t전자공학회논문지SD(Semiconductor  and  Devices)  :  반도체▼g제38권  제11호  (2001  11)▼d2001,  11
■SIS    ▼aS009634▼b60014354▼h8▼s2

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