MARC

 008050713s2001        ULKa    a                          KOR
■022    ▼a12296368
■245    ▼aGaAs  metal-semiconductor  field-effect  transistor에서  표면  결함이  소자의  전달컨덕턴스  분산  및  게이트  표면  누설  전류에  미치는  영향▼d최경진,  이종람  공저
■260    ▼a서울▼b대한전자공학회▼c2001.
■300    ▼app.  8-16
■653    ▼aGAAS▼aMETALSEMICONDUCTOR▼aFIELDEFFECT▼aTRANSISTOR에서▼a표면▼a결함▼a소자▼a전달▼a분산▼a게이트▼a누설▼a전류
■700    ▼a최경진,  이종람
■773    ▼t전자공학회논문지SD(Semiconductor  and  Devices)  :  반도체▼g제38권  제10호  (2001  10)▼d2001,  10
■SIS    ▼aS009633▼b60014354▼h8▼s2

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