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Fault-tolerance and reliability techniques for high-density random-access memories
Fault-tolerance and reliability techniques for high-density random-access memories
Detailed Information
- 자료유형
- 단행본
- ISBN
- 0130084654
- 청구기호
- 566.43 C435f
- 서명/저자
- Fault-tolerance and reliability techniques for high-density random-access memories / Kanad Chakraborty, Pinaki Mazumder.
- 발행사항
- Upper Saddle River, NJ : Prentice Hall, c2002.
- 형태사항
- xix, 426 p. : ill. ; 25cm.
- 총서명
- Prentice Hall modern semiconductor design series
- 서지주기
- Includes bibliographical references (p. 377-417) and index.
- 기타저자
- Mazumder, Pinaki.
- 가격
- 29000
- Control Number
- kjul:60035821
MARC
008041130s2002 njua b 001 0 eng■020 ▼a0130084654
■035 ▼aKRIC08880365
■090 ▼a566.43▼bC435f
■1001 ▼aChakraborty, Kanad.
■24510▼aFault-tolerance and reliability techniques for high-density random-access memories▼dKanad Chakraborty, Pinaki Mazumder.
■260 ▼aUpper Saddle River, NJ▼bPrentice Hall▼cc2002.
■300 ▼axix, 426 p.▼bill.▼c25cm.
■44000▼aPrentice Hall modern semiconductor design series
■504 ▼aIncludes bibliographical references (p. 377-417) and index.
■650 0▼aRandom access memory▼xReliability
■650 0▼aIntegrated circuits▼xFault tolerance
■650 0▼aSemiconeductor storage devices
■7001 ▼aMazumder, Pinaki.
■9500 ▼b29000
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