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Failure mechanisms in semiconductor devices
Failure mechanisms in semiconductor devices
상세정보
- 자료유형
- 단행본
- ISBN
- 0471954829
- 청구기호
- 569.3 A512f
- 서명/저자
- Failure mechanisms in semiconductor devices / E. Ajith Amerasekera , Farid N. Najm.
- 발행사항
- New York : John Wiley & Sons, 1997.
- 형태사항
- xii, 345 p. : ill. ; 23 cm.
- 서지주기
- Includes bibliographical references and index
- 기타저자
- Najm, Farid N
- 가격
- 26000
- Control Number
- kjul:50047356
MARC
008010831s1997 us 1 eng■020 ▼a0471954829
■035 ▼aKRIC02005517
■090 ▼a569.3▼bA512f
■1001 ▼aAmerasekera, E Ajith
■24510▼aFailure mechanisms in semiconductor devices▼dE. Ajith Amerasekera▼eFarid N. Najm.
■260 ▼aNew York▼bJohn Wiley & Sons▼c1997.
■300 ▼axii, 345 p.▼bill.▼c23 cm.
■504 ▼aIncludes bibliographical references and index
■7001 ▼aNajm, Farid N
■9500 ▼b26000
