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Fundamentals of surface and thin film analysis
Fundamentals of surface and thin film analysis
Detailed Information
- 자료유형
- 단행본
- ISBN
- 0444009892
- 청구기호
- 421.7 F312f
- 서명/저자
- Fundamentals of surface and thin film analysis / Leonard C. Feldman and James W. Mayer.
- 발행사항
- Amsterdam : North-Holland, 1986.
- 형태사항
- xviii, 352 p. : ill. ; 24 cm.
- 서지주기
- Includes index
- 기타저자
- Mayer, James W
- 가격
- 22000
- Control Number
- kjul:50046442
MARC
008010817s1986 us 1 eng■020 ▼a0444009892
■035 ▼aKRIC00400772
■090 ▼a421.7▼bF312f
■1001 ▼aFeldman, Leonard C
■24510▼aFundamentals of surface and thin film analysis▼dLeonard C. Feldman and James W. Mayer.
■260 ▼aAmsterdam▼bNorth-Holland▼c1986.
■300 ▼axviii, 352 p.▼bill.▼c24 cm.
■504 ▼aIncludes index
■7001 ▼aMayer, James W
■9500 ▼b22000
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