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Proceeding international test conference 1993 : Designing, texting, and diagnostics-join them, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
Proceeding international test conference 1993 : Designing, texting, and diagnostics-join them, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
Detailed Information
- 자료유형
- 참고자료
- ISBN
- 0780314298
- 청구기호
- 569.306 I22p
- 서명/저자
- Proceeding international test conference 1993 : Designing, texting, and diagnostics-join them, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA / sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
- 발행사항
- New York : Institute of Electrical and Electr, 1993.
- 형태사항
- xii, 1065 p. : illus. ; 26 cm.
- 서지주기
- includes bibliographical references and index
- 가격
- 50000
- Control Number
- kjul:50031040
MARC
008010918s1993 us a 001 eng■020 ▼a0780314298
■090 ▼a569.306▼bI22p
■1001 ▼aIEEE Computer Society Test Technology Technical Committee
■24510▼aProceeding international test conference 1993▼bDesigning, texting, and diagnostics-join them, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA▼dsponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section
■260 ▼aNew York▼bInstitute of Electrical and Electr▼c1993.
■300 ▼axii, 1065 p.▼billus.▼c26 cm.
■504 ▼aincludes bibliographical references and index
■7001 ▼aIEEE Philadelphia Section
■9500 ▼b50000
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