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Failure Mechanisms in semicodnuctor Devices
Failure Mechanisms in semicodnuctor Devices
Detailed Information
- 자료유형
- 단행본
- ISBN
- 0471954829
- 청구기호
- 569.8 A512f
- 서명/저자
- Failure Mechanisms in semicodnuctor Devices / E Ajith Amerasekera and Farid N Najm.
- 발행사항
- Chichester : John Wiley & Sons, 1997.
- 형태사항
- xi, 345 p. ; 23cm.
- 서지주기
- includes reference and index.
- 기타저자
- Najm, Farid N
- 가격
- 28000
- Control Number
- kjul:50027822
MARC
008010905s1997 us 001 eng■005 20010905133724.0
■020 ▼a0471954829
■035 ▼aKRIC07856323
■090 ▼a569.8▼bA512f
■1001 ▼aAmerasekera, E Ajith
■24510▼aFailure Mechanisms in semicodnuctor Devices▼dE Ajith Amerasekera and Farid N Najm.
■260 ▼aChichester▼bJohn Wiley & Sons▼c1997.
■300 ▼axi, 345 p.▼c23cm.
■504 ▼aincludes reference and index.
■7001 ▼aNajm, Farid N
■9500 ▼b28000
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