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Semiconductor material and device characterization
Semiconductor material and device characterization
Detailed Information
- 자료유형
- 단행본
- 청구기호
- 569.4 S382s
- 서명/저자
- Semiconductor material and device characterization / Dieter K. Schroder.
- 발행사항
- New York : John Wiley & Sons, 1990.
- 형태사항
- 599 p. ; 23cm.
- 서지주기
- includes bibliographical references.
- 가격
- 35000
- Control Number
- kjul:50027821
MARC
008010905s1990 us 000 eng■005 20010830151232.0
■035 ▼aKRIC00575844
■090 ▼a569.4▼bS382s
■1001 ▼aSchroder, Dieter K.
■24510▼aSemiconductor material and device characterization▼dDieter K. Schroder.
■260 ▼aNew York▼bJohn Wiley & Sons▼c1990.
■300 ▼a599 p.▼c23cm.
■504 ▼aincludes bibliographical references.
■9500 ▼b35000
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| Reg No. | Количество платежных | Местоположение | статус | Ленд информации |
|---|---|---|---|---|
| W027821 | 569.4 S382s | 서양서제2서고 | 대출가능 |
대출가능 My Folder 부재도서신고 |
| W047254 | 569.4 S382s c.2 | 서양서제2서고 | 대출가능 |
대출가능 My Folder 부재도서신고 |
| W047255 | 569.4 S382s c.3 | 서양서제2서고 | 대출가능 |
대출가능 My Folder 부재도서신고 |
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