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Proceedings international conference on Wafer Scale Integration
Proceedings international conference on Wafer Scale Integration / ed. by Vljay K Jain and ...
Proceedings international conference on Wafer Scale Integration

Detailed Information

자료유형  
 단행본
청구기호  
569 J25p
저자명  
Jain, Vljay K
서명/저자  
Proceedings international conference on Wafer Scale Integration / ed. by Vljay K Jain and Peter W Wyatt.
발행사항  
Washington : IEEE, 1992.
형태사항  
363 p. : 23cm.
서지주기  
includes index.
기타저자  
Wyatt, Peter W
기타서명  
30000
Control Number  
kjul:50027700

MARC

 008010905s1997        us                        000      eng
■005    20010905105554.0
■035    ▼aKRIC04394286
■090    ▼a569▼bJ25p
■1001  ▼aJain,  Vljay  K
■24510▼aProceedings  international  conference  on  Wafer  Scale  Integration▼ded.  by  Vljay  K  Jain  and  Peter  W  Wyatt.
■260    ▼aWashington▼bIEEE▼c1992.
■300    ▼a363  p.▼b23cm.
■5040  ▼aincludes  index.
■7001  ▼aWyatt,  Peter  W
■740  0▼a30000

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