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Proceedings international conference on Wafer Scale Integration
Proceedings international conference on Wafer Scale Integration
상세정보
- 자료유형
- 단행본
- 청구기호
- 569 J25p
- 저자명
- Jain, Vljay K
- 서명/저자
- Proceedings international conference on Wafer Scale Integration / ed. by Vljay K Jain and Peter W Wyatt.
- 발행사항
- Washington : IEEE, 1992.
- 형태사항
- 363 p. : 23cm.
- 서지주기
- includes index.
- 기타저자
- Wyatt, Peter W
- 기타서명
- 30000
- Control Number
- kjul:50027700
MARC
008010905s1997 us 000 eng■005 20010905105554.0
■035 ▼aKRIC04394286
■090 ▼a569▼bJ25p
■1001 ▼aJain, Vljay K
■24510▼aProceedings international conference on Wafer Scale Integration▼ded. by Vljay K Jain and Peter W Wyatt.
■260 ▼aWashington▼bIEEE▼c1992.
■300 ▼a363 p.▼b23cm.
■5040 ▼aincludes index.
■7001 ▼aWyatt, Peter W
■740 0▼a30000
