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VLSI testing
VLSI testing
상세정보
- 자료유형
- 단행본
- ISBN
- 0444878955
- 청구기호
- 569.47 S999v
- 저자명
- T.W.Williams
- 서명/저자
- VLSI testing / ed. by T.W.Williams.
- 발행사항
- New York : North-Holland, 1986.
- 형태사항
- ix, 275 p. : ill. ; 23 cm.
- 총서명
- Advances in CAD for VLSI ; 5
- 서지주기
- includes bibliographical references
- 가격
- 20000
- Control Number
- kjul:50026567
MARC
008010917s1986 us a 000 eng■005 20010917115936.0
■020 ▼a0444878955
■035 ▼aKRIC00396375
■090 ▼a569.47▼bS999v
■1001 ▼aT.W.Williams
■24510▼aVLSI testing▼ded. by T.W.Williams.
■260 ▼aNew York▼bNorth-Holland▼c1986.
■300 ▼aix, 275 p.▼bill.▼c23 cm.
■49010▼aAdvances in CAD for VLSI▼v5
■504 ▼aincludes bibliographical references
■9500 ▼b20000
