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Testing and testable design of high-density random-access memories
Testing and testable design of high-density random-access memories
Detailed Information
- 자료유형
- 단행본
- 청구기호
- 566.4 M476t
- 저자명
- Mazumder, Pinaki
- 서명/저자
- Testing and testable design of high-density random-access memories / Pinaki Mazumder , Kanad Chakraborty.
- 발행사항
- Boston : Kluwer Academic publishers, 1996.
- 형태사항
- xxxviii, 386 p. : ill. ; 23 cm.
- 총서명
- Frontiers in electronic testing
- 서지주기
- Includes index and bibliographical references
- 기타저자
- Chakraborty, Kanad
- 가격
- 36200
- Control Number
- kjul:50026264
MARC
008010914s1996 us a 001 eng■005 20010914151424.0
■035 ▼aKRIC02007779
■090 ▼a566.4▼bM476t
■1001 ▼aMazumder, Pinaki
■24510▼aTesting and testable design of high-density random-access memories▼dPinaki Mazumder▼eKanad Chakraborty.
■260 ▼aBoston▼bKluwer Academic publishers▼c1996.
■300 ▼axxxviii, 386 p.▼bill.▼c23 cm.
■49010▼aFrontiers in electronic testing
■504 ▼aIncludes index and bibliographical references
■7001 ▼aChakraborty, Kanad
■9500 ▼b36200
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