인쇄
미지정
도서명 :
Accurate Extraction
of Crosstalk Induced Dynamic Variation of Coupling Capacitance for Interconnect Lines of CMOSFETs
저 자 :
Yong Goo-Kim, Hee-Hwan Ji, Hyung Sun Yoon, Sung H
청구기호 :
소장처 :
참고자료실(관광학관2층)
대출요구사항 :
출력