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내장 메모리 테스트를 위한 BIST 회로 자동생성기
내장 메모리 테스트를 위한 BIST 회로 자동생성기 / 양선웅, 장훈 공저
내장 메모리 테스트를 위한 BIST 회로 자동생성기

Detailed Information

자료유형  
 기사
ISSN  
12296368
서명/저자  
내장 메모리 테스트를 위한 BIST 회로 자동생성기 / 양선웅, 장훈 공저
발행사항  
서울 : 대한전자공학회, 2001.
형태사항  
pp. 76-83
키워드  
내장 메모리 테스트 위한 BIST 회로 자동 생성기
기타저자  
양선웅, 장훈
기본자료저록  
전자공학회논문지SD(Semiconductor and Devices) : 반도체 : 제38권 제10호 (2001 10) 2001, 10
모체레코드  
모체정보확인
Control Number  
kjul:60044050

MARC

 008050713s2001        ULKa    a                          KOR
■022    ▼a12296368
■245    ▼a내장  메모리  테스트를  위한  BIST  회로  자동생성기▼d양선웅,  장훈  공저
■260    ▼a서울▼b대한전자공학회▼c2001.
■300    ▼app.  76-83
■653    ▼a내장▼a메모리▼a테스트▼a위한▼aBIST▼a회로▼a자동▼a생성기
■700    ▼a양선웅,  장훈
■773    ▼t전자공학회논문지SD(Semiconductor  and  Devices)  :  반도체▼g제38권  제10호  (2001  10)▼d2001,  10
■SIS    ▼aS009633▼b60014354▼h8▼s2

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