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CMOS 回路의 테스트 패턴 生成에 관한 硏究
CMOS 回路의 테스트 패턴 生成에 관한 硏究 / 金載佑 著.
CMOS 回路의 테스트 패턴 生成에 관한 硏究

Detailed Information

자료유형  
 학위논문
KDC  
569.3-3
청구기호  
569.3 김73c
저자명  
김재우
서명/저자  
CMOS 回路의 테스트 패턴 生成에 관한 硏究 / 金載佑 著.
발행사항  
서울 : 漢陽大學校 産業大學院, 1989.
형태사항  
ii,37 p. ; 26 cm.
학위논문주기  
석사학위논문 - 한양대학교 산업대학원 : 전자공학, 1989
일반주제명  
전자관회로
키워드  
생성 패턴 CMOS 회로 테스트
가격  
4000
Control Number  
kjul:40003539

MARC

 008960621s1989        ulk                AX  000a    kor
■056    ▼a569.3▼23
■090    ▼a569.3▼b김73c
■1001  ▼a김재우
■24510▼aCMOS  回路의  테스트  패턴  生成에  관한  硏究▼d金載佑  著.
■260    ▼a서울▼b漢陽大學校  産業大學院▼c1989.
■300    ▼aii,37  p.▼c26  cm.
■5020  ▼a석사학위논문▼b한양대학교  산업대학원▼c전자공학▼d1989
■650  0▼a전자관회로
■653    ▼a생성▼a패턴▼aCMOS▼a회로▼a테스트
■9500  ▼b4000

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